Data integrity first
Range guards, null checks, time-series continuity, and cross-field consistency checks tuned to wafer, lot, and unit IDs.
Analog device DNA
Continuous quality scoring beyond pass/fail to capture the nuance between edge-pass and hero devices.
Adaptive test strategy
Test skip recommendations and selective re-runs guided by model confidence and human overrides.
Drift + degradation alerts
Temporal monitoring on key parameters (Iddq, Vout, leakage, THD) with alerting hooks.
Qualification foresight
Use parametric signals to forecast qualification risk and bin routing by sigma profile.
Transparent ML
Versioned models with confusion matrices, precision/recall, and feature importance surfaced to engineers.